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Each line is independently controlled and can be individually configured as an input or output. Multiple ScanIOLV modules can be cascaded in series providing a sufficient number of pins for almost any digital test environment. Showing results 1 – 15 of 26 products found. The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability. The test patterns generated by the PCI

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Multiple ScanIOLV modules can be cascaded in series providing a sufficient number of pins for almost any digital test environment.

Jtag-controllers – All Manufacturers –

Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. JTAG control is muxed to each part through the use of an independent clock for each part.

Click on a button to share this product: This wide choice of platforms allows greater flexibility to meet specific price and performance criteria for a given application while maintaining complete software transportability across all hardware platforms.

Showing results 1 – 15 of 26 products found. Keep me logged coreliw. Click on the link below to download: Corelis has developed a wide range of high-performance boundary-scan controllers that are compatible with buses such as USB 2. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ”kernel-centric” testing.

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A brief description of each controller follows. The test patterns generated by the PCI Corelis has designed special hardware that autonomously performs concurrent gang testing and programming of multiple units without additional user intervention.

This facilitates easy configuration to many different JTAG ports, which is helpful in design and manufacturing. Coreliz test is implemented through a standard JTAG interface. The ScanIOLV module provides a total of fully bidirectional test channels with virtually unlimited memory depth per pin. Signup to manage your products! It uses boundary-scan compatible ASICs to add control and visibility to connectors, traces, and logic that can not be tested using traditional scan techniques.

Corelis – JTAG HW controllers & HW test modules

For complete information on the controllers, please refer to the detailed datasheets. Hardware is available for development, production and repair environments. By combining ICT and boundary-scan, test engineers gain benefits from both corelsi for the highest possible test coverage, speed, and capability.

The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques. The controller connects to the computer corelsi through the USB interface or LAN interface for easy installation at nearby or remote locations. The entire testing and programming, including on-the-fly verification of results, is done in modular and expandable hardware.

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Engineers and technicians alike can use the system for a variety of tasks. Each line is independently controlled and can be individually configured as an input or output. Udb separate serial clock and command interface may be used if required to provide device initialization sequences. I forgot my password.

Enter your email address and password to login. Up to 40 controllers may be ccorelis powered and monitored for functionality using the process test interface of the Optimum WinAOS application.

The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test UUT. Each part may have 2 separate biases featuring both current and voltage monitoring.